Technical Parameters
|
Main Structure |
Loadlock Chamber + Process Chamber |
|
Process Chamber Dimensions |
Diameter 1040mm, Height 960mm |
|
Ultimate Vacuum |
Below 4.0E-5Pa |
|
Leak Rate |
≤5E-9Pa·m³/s (Helium Leak Rate) / Pressure Holding ≤5Pa for 12 Hours |
|
Substrate Size |
Max. 12 Inches |
|
Ion Source System |
16cm RF Main Source + 12cm RF Auxiliary Source |
|
Sputtering Target System |
Equipped with 4 Square Targets (Adjustable Target Positions) |
|
Film Thickness System |
Transmission Optical Monitoring System / In-line Crystal Oscillator System |
|
Film Thickness Uniformity |
≤±0.5% (Beyond Radius 70mm) |
|
Vacuum System |
Dry Pump + Molecular Pump or Dry Pump + Cryopump |
|
Wafer Transfer Failure Rate |
≤1% |
|
Equipment Dimensions |
3500 mm (W) × 2200 mm (D) × 2750 mm (H) |

